Scanning Electron Microscopes (SEM)
Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science, to forensics, to industrial manufacturing, and even to the life sciences.
Dual Beam Electron Microscopes
Combined focused ion beam-scanning electron microscopes are microscopy systems that combine the capabilities of scanning electron and focused ion beam microscopy techniques.
Transmission Electron Microscopes (TEM)
Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image.