Scanning Electron Microscopes (SEM)
Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science, to forensics, to industrial manufacturing, and even to the life sciences.
Dual Beam Electron Microscopes
Combined focused ion beam-scanning electron microscopes are microscopy systems that combine the capabilities of scanning electron and focused ion beam microscopy techniques.
Transmission Electron Microscopes (TEM)
Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image.
MESLO Egypt offers you a vast range of scientific and laboratory equipment covered by the best possible services
In order to preview another product category please choose an option from the dropdown:
Laboratory solutions for vast range of industries
Check out our solution by selecting an industry to explore from the dropdown below: